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Electronics
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Matlab and Mathematica
Verilog / VHDL
Wireless
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$50 USD / hora
Bandera de ITALY
roma, italy
$50 USD / hora
Aquí son las 7:52 p. m.
Se unió el septiembre 13, 2016
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Michele M.

@lomielectronics

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$50 USD / hora
Bandera de ITALY
roma, italy
$50 USD / hora
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Electronics Designers

We are a team able to design a complete project from the schematics to PCB layout. Our main skills are circuit developments, schematic simulations and firmware implementation both on Microchip microcontroller and FPGA. We can perform test by Labview Graphical User Interface (GUI) on electronics component or units.
Freelancer Wireless Engineers Italy
Ver todo Wireless Engineers en Italy

Contacta Michele M. sobre tu trabajo

Inicia sesión para comentar cualquier detalle por chat.

Portafolio

2969513
Digital Geiger Counter Design
Based on a PIC32 microcontroller, the schematic was designed and critical parts simulated. The Geiger tubes are supplied by a flyback DC-DC stage with 600V on its output. A smart algorithm was implemented to improve the radiation events detection and to control the TFT display and touch screen. All the firmware was written in assembler and ANSI C languages (MPLab X-IDE suite). The PCB was designed on Altium Designer Suite.
Digital Geiger Counter Design
Based on a PIC32 microcontroller, the schematic was designed and critical parts simulated. The Geiger tubes are supplied by a flyback DC-DC stage with 600V on its output. A smart algorithm was implemented to improve the radiation events detection and to control the TFT display and touch screen. All the firmware was written in assembler and ANSI C languages (MPLab X-IDE suite). The PCB was designed on Altium Designer Suite.
Digital Geiger Counter Design
Based on a PIC32 microcontroller, the schematic was designed and critical parts simulated. The Geiger tubes are supplied by a flyback DC-DC stage with 600V on its output. A smart algorithm was implemented to improve the radiation events detection and to control the TFT display and touch screen. All the firmware was written in assembler and ANSI C languages (MPLab X-IDE suite). The PCB was designed on Altium Designer Suite.
Digital Geiger Counter Design
2968419
• Schematics design and simulation check • PCB development on Altium • Setup for remote control on 10 components simultaneously. • SPI communication design in Labview through PXI to test 10 devices in the same time. • Board design to allow temperature testing at very high and low temperatures (-55°+125°C). • Real time monitoring for all test duration ad current acquisition for every component and automatic programming for the test.
ADS1258 Analog to Digital Converter Testing
• Schematics design and simulation check • PCB development on Altium • Setup for remote control on 10 components simultaneously. • SPI communication design in Labview through PXI to test 10 devices in the same time. • Board design to allow temperature testing at very high and low temperatures (-55°+125°C). • Real time monitoring for all test duration ad current acquisition for every component and automatic programming for the test.
ADS1258 Analog to Digital Converter Testing
• Schematics design and simulation check • PCB development on Altium • Setup for remote control on 10 components simultaneously. • SPI communication design in Labview through PXI to test 10 devices in the same time. • Board design to allow temperature testing at very high and low temperatures (-55°+125°C). • Real time monitoring for all test duration ad current acquisition for every component and automatic programming for the test.
ADS1258 Analog to Digital Converter Testing
• Schematics design and simulation check • PCB development on Altium • Setup for remote control on 10 components simultaneously. • SPI communication design in Labview through PXI to test 10 devices in the same time. • Board design to allow temperature testing at very high and low temperatures (-55°+125°C). • Real time monitoring for all test duration ad current acquisition for every component and automatic programming for the test.
ADS1258 Analog to Digital Converter Testing
• Schematics design and simulation check • PCB development on Altium • Setup for remote control on 10 components simultaneously. • SPI communication design in Labview through PXI to test 10 devices in the same time. • Board design to allow temperature testing at very high and low temperatures (-55°+125°C). • Real time monitoring for all test duration ad current acquisition for every component and automatic programming for the test.
ADS1258 Analog to Digital Converter Testing
• Schematics design and simulation check • PCB development on Altium • Setup for remote control on 10 components simultaneously. • SPI communication design in Labview through PXI to test 10 devices in the same time. • Board design to allow temperature testing at very high and low temperatures (-55°+125°C). • Real time monitoring for all test duration ad current acquisition for every component and automatic programming for the test.
ADS1258 Analog to Digital Converter Testing
2967684
• 16 Channels Multimeter 50kS/s up to 30V • Current, Voltage, Resistance and Temperature Monitoring • FT232 microcontroller for USB to SPI programming • Up to 6 layer ready to use upgrade (64 channels) • Free Labview interface, and user editable
Modular Digital Multimeter
• 16 Channels Multimeter 50kS/s up to 30V • Current, Voltage, Resistance and Temperature Monitoring • FT232 microcontroller for USB to SPI programming • Up to 6 layer ready to use upgrade (64 channels) • Free Labview interface, and user editable
Modular Digital Multimeter
• 16 Channels Multimeter 50kS/s up to 30V • Current, Voltage, Resistance and Temperature Monitoring • FT232 microcontroller for USB to SPI programming • Up to 6 layer ready to use upgrade (64 channels) • Free Labview interface, and user editable
Modular Digital Multimeter
2967674
• Schematic development and signal integrity check on device • Test Board Design Altium (6 Layers) according to standard FMC (VITA 42.1) • Hardware Test Development in VHDL using FPGA Artix 7 to control, in real time, SRAM bit flips in accordance to a fixed pattern. • Latch-up event observation through a current sensor (INA196) and an Oscilloscope MSO9104, programmed in MATLAB for real time control. • Labview programming for automatic errors acquisition through UART-RS232 protocol and current acquisitions sourced by Power Supply (Hameg HMP4040 and Agilent E3631). • Automatic Closed Loop Temperature Control through sensor (TC1047A) and heater (HPG-1 09) for temperature test at 55°C.
Testing of Cypress SRAM
• Schematic development and signal integrity check on device • Test Board Design Altium (6 Layers) according to standard FMC (VITA 42.1) • Hardware Test Development in VHDL using FPGA Artix 7 to control, in real time, SRAM bit flips in accordance to a fixed pattern. • Latch-up event observation through a current sensor (INA196) and an Oscilloscope MSO9104, programmed in MATLAB for real time control. • Labview programming for automatic errors acquisition through UART-RS232 protocol and current acquisitions sourced by Power Supply (Hameg HMP4040 and Agilent E3631). • Automatic Closed Loop Temperature Control through sensor (TC1047A) and heater (HPG-1 09) for temperature test at 55°C.
Testing of Cypress SRAM
• Schematic development and signal integrity check on device • Test Board Design Altium (6 Layers) according to standard FMC (VITA 42.1) • Hardware Test Development in VHDL using FPGA Artix 7 to control, in real time, SRAM bit flips in accordance to a fixed pattern. • Latch-up event observation through a current sensor (INA196) and an Oscilloscope MSO9104, programmed in MATLAB for real time control. • Labview programming for automatic errors acquisition through UART-RS232 protocol and current acquisitions sourced by Power Supply (Hameg HMP4040 and Agilent E3631). • Automatic Closed Loop Temperature Control through sensor (TC1047A) and heater (HPG-1 09) for temperature test at 55°C.
Testing of Cypress SRAM
• Schematic development and signal integrity check on device • Test Board Design Altium (6 Layers) according to standard FMC (VITA 42.1) • Hardware Test Development in VHDL using FPGA Artix 7 to control, in real time, SRAM bit flips in accordance to a fixed pattern. • Latch-up event observation through a current sensor (INA196) and an Oscilloscope MSO9104, programmed in MATLAB for real time control. • Labview programming for automatic errors acquisition through UART-RS232 protocol and current acquisitions sourced by Power Supply (Hameg HMP4040 and Agilent E3631). • Automatic Closed Loop Temperature Control through sensor (TC1047A) and heater (HPG-1 09) for temperature test at 55°C.
Testing of Cypress SRAM
• Schematic development and signal integrity check on device • Test Board Design Altium (6 Layers) according to standard FMC (VITA 42.1) • Hardware Test Development in VHDL using FPGA Artix 7 to control, in real time, SRAM bit flips in accordance to a fixed pattern. • Latch-up event observation through a current sensor (INA196) and an Oscilloscope MSO9104, programmed in MATLAB for real time control. • Labview programming for automatic errors acquisition through UART-RS232 protocol and current acquisitions sourced by Power Supply (Hameg HMP4040 and Agilent E3631). • Automatic Closed Loop Temperature Control through sensor (TC1047A) and heater (HPG-1 09) for temperature test at 55°C.
Testing of Cypress SRAM
2969513
Digital Geiger Counter Design
Based on a PIC32 microcontroller, the schematic was designed and critical parts simulated. The Geiger tubes are supplied by a flyback DC-DC stage with 600V on its output. A smart algorithm was implemented to improve the radiation events detection and to control the TFT display and touch screen. All the firmware was written in assembler and ANSI C languages (MPLab X-IDE suite). The PCB was designed on Altium Designer Suite.
Digital Geiger Counter Design
Based on a PIC32 microcontroller, the schematic was designed and critical parts simulated. The Geiger tubes are supplied by a flyback DC-DC stage with 600V on its output. A smart algorithm was implemented to improve the radiation events detection and to control the TFT display and touch screen. All the firmware was written in assembler and ANSI C languages (MPLab X-IDE suite). The PCB was designed on Altium Designer Suite.
Digital Geiger Counter Design
Based on a PIC32 microcontroller, the schematic was designed and critical parts simulated. The Geiger tubes are supplied by a flyback DC-DC stage with 600V on its output. A smart algorithm was implemented to improve the radiation events detection and to control the TFT display and touch screen. All the firmware was written in assembler and ANSI C languages (MPLab X-IDE suite). The PCB was designed on Altium Designer Suite.
Digital Geiger Counter Design
2968419
• Schematics design and simulation check • PCB development on Altium • Setup for remote control on 10 components simultaneously. • SPI communication design in Labview through PXI to test 10 devices in the same time. • Board design to allow temperature testing at very high and low temperatures (-55°+125°C). • Real time monitoring for all test duration ad current acquisition for every component and automatic programming for the test.
ADS1258 Analog to Digital Converter Testing
• Schematics design and simulation check • PCB development on Altium • Setup for remote control on 10 components simultaneously. • SPI communication design in Labview through PXI to test 10 devices in the same time. • Board design to allow temperature testing at very high and low temperatures (-55°+125°C). • Real time monitoring for all test duration ad current acquisition for every component and automatic programming for the test.
ADS1258 Analog to Digital Converter Testing
• Schematics design and simulation check • PCB development on Altium • Setup for remote control on 10 components simultaneously. • SPI communication design in Labview through PXI to test 10 devices in the same time. • Board design to allow temperature testing at very high and low temperatures (-55°+125°C). • Real time monitoring for all test duration ad current acquisition for every component and automatic programming for the test.
ADS1258 Analog to Digital Converter Testing
• Schematics design and simulation check • PCB development on Altium • Setup for remote control on 10 components simultaneously. • SPI communication design in Labview through PXI to test 10 devices in the same time. • Board design to allow temperature testing at very high and low temperatures (-55°+125°C). • Real time monitoring for all test duration ad current acquisition for every component and automatic programming for the test.
ADS1258 Analog to Digital Converter Testing
• Schematics design and simulation check • PCB development on Altium • Setup for remote control on 10 components simultaneously. • SPI communication design in Labview through PXI to test 10 devices in the same time. • Board design to allow temperature testing at very high and low temperatures (-55°+125°C). • Real time monitoring for all test duration ad current acquisition for every component and automatic programming for the test.
ADS1258 Analog to Digital Converter Testing
• Schematics design and simulation check • PCB development on Altium • Setup for remote control on 10 components simultaneously. • SPI communication design in Labview through PXI to test 10 devices in the same time. • Board design to allow temperature testing at very high and low temperatures (-55°+125°C). • Real time monitoring for all test duration ad current acquisition for every component and automatic programming for the test.
ADS1258 Analog to Digital Converter Testing
2967684
• 16 Channels Multimeter 50kS/s up to 30V • Current, Voltage, Resistance and Temperature Monitoring • FT232 microcontroller for USB to SPI programming • Up to 6 layer ready to use upgrade (64 channels) • Free Labview interface, and user editable
Modular Digital Multimeter
• 16 Channels Multimeter 50kS/s up to 30V • Current, Voltage, Resistance and Temperature Monitoring • FT232 microcontroller for USB to SPI programming • Up to 6 layer ready to use upgrade (64 channels) • Free Labview interface, and user editable
Modular Digital Multimeter
• 16 Channels Multimeter 50kS/s up to 30V • Current, Voltage, Resistance and Temperature Monitoring • FT232 microcontroller for USB to SPI programming • Up to 6 layer ready to use upgrade (64 channels) • Free Labview interface, and user editable
Modular Digital Multimeter
2967674
• Schematic development and signal integrity check on device • Test Board Design Altium (6 Layers) according to standard FMC (VITA 42.1) • Hardware Test Development in VHDL using FPGA Artix 7 to control, in real time, SRAM bit flips in accordance to a fixed pattern. • Latch-up event observation through a current sensor (INA196) and an Oscilloscope MSO9104, programmed in MATLAB for real time control. • Labview programming for automatic errors acquisition through UART-RS232 protocol and current acquisitions sourced by Power Supply (Hameg HMP4040 and Agilent E3631). • Automatic Closed Loop Temperature Control through sensor (TC1047A) and heater (HPG-1 09) for temperature test at 55°C.
Testing of Cypress SRAM
• Schematic development and signal integrity check on device • Test Board Design Altium (6 Layers) according to standard FMC (VITA 42.1) • Hardware Test Development in VHDL using FPGA Artix 7 to control, in real time, SRAM bit flips in accordance to a fixed pattern. • Latch-up event observation through a current sensor (INA196) and an Oscilloscope MSO9104, programmed in MATLAB for real time control. • Labview programming for automatic errors acquisition through UART-RS232 protocol and current acquisitions sourced by Power Supply (Hameg HMP4040 and Agilent E3631). • Automatic Closed Loop Temperature Control through sensor (TC1047A) and heater (HPG-1 09) for temperature test at 55°C.
Testing of Cypress SRAM
• Schematic development and signal integrity check on device • Test Board Design Altium (6 Layers) according to standard FMC (VITA 42.1) • Hardware Test Development in VHDL using FPGA Artix 7 to control, in real time, SRAM bit flips in accordance to a fixed pattern. • Latch-up event observation through a current sensor (INA196) and an Oscilloscope MSO9104, programmed in MATLAB for real time control. • Labview programming for automatic errors acquisition through UART-RS232 protocol and current acquisitions sourced by Power Supply (Hameg HMP4040 and Agilent E3631). • Automatic Closed Loop Temperature Control through sensor (TC1047A) and heater (HPG-1 09) for temperature test at 55°C.
Testing of Cypress SRAM
• Schematic development and signal integrity check on device • Test Board Design Altium (6 Layers) according to standard FMC (VITA 42.1) • Hardware Test Development in VHDL using FPGA Artix 7 to control, in real time, SRAM bit flips in accordance to a fixed pattern. • Latch-up event observation through a current sensor (INA196) and an Oscilloscope MSO9104, programmed in MATLAB for real time control. • Labview programming for automatic errors acquisition through UART-RS232 protocol and current acquisitions sourced by Power Supply (Hameg HMP4040 and Agilent E3631). • Automatic Closed Loop Temperature Control through sensor (TC1047A) and heater (HPG-1 09) for temperature test at 55°C.
Testing of Cypress SRAM
• Schematic development and signal integrity check on device • Test Board Design Altium (6 Layers) according to standard FMC (VITA 42.1) • Hardware Test Development in VHDL using FPGA Artix 7 to control, in real time, SRAM bit flips in accordance to a fixed pattern. • Latch-up event observation through a current sensor (INA196) and an Oscilloscope MSO9104, programmed in MATLAB for real time control. • Labview programming for automatic errors acquisition through UART-RS232 protocol and current acquisitions sourced by Power Supply (Hameg HMP4040 and Agilent E3631). • Automatic Closed Loop Temperature Control through sensor (TC1047A) and heater (HPG-1 09) for temperature test at 55°C.
Testing of Cypress SRAM

Comentarios

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Experiencia

Electronics Test Engineer

IMT Srl
sept 2012 - Presente
• Radiation Effect Analysis by radiation on digital, analogic and Radiofrequency devices used in space applications (FPGA, DAC, ADC, OPA, LVR, DC/DC, MOSFET, HEXFET, BJT) • Test Board Design and realization in Altium according to MIL-STD-883 and ESA/SCC 22900 standards. • Test Program developing in Labview and Matlab for National Instruments PXI and Agilent equipment (Oscilloscope, multimeter, programmable power supply)

Digital Subsystem Manager

IMT srl
may 2008 - Presente
On Board Computer and Data Handling design for a 3U CubeSat satellite based on PIC32MZ micro controller with flash memory bank, NOR and RAM. PLL on board, battery backup system and Real-time Clock and Calendar (RTCC).

Neural Net Mixed Signal Design

Neulos Visiotech S.r.l.
dic 2011 - sept 2012 (9 meses, 1 día)
• Logic Function analysis made with Neural Net. • Simulations in OrCAD PSPICE • Printed Circuit Board design with analog devices in OrCAD PCB Editor • Project Functional Test with various equipment (oscilloscope, multimeter, spectrum analyzer)

Educación

Master degree

Università degli Studi di Roma 'La Sapienza', Italy 2005 - 2011
(6 años)

Publicaciones

Innovative Solar Array Drive Assembly for CubeSat Satellite

ESA-CNES 4S Symposium 2016
Development of orientable and deployable solar panels to increase the generated power up to 40W on 3U CubeSat platforms.

Miniaturized Bio-Sensor for environment monitoring in Manned Space Mission

IEEE nano 2015
Miniaturized biosensor based on yields to evaluate the pollution in micro gravity environment during space missions.

Desing and realization of an innovative deployable solar panel system for cubesats

IAC 2012 International Astronautical Congress
A new solar panel structure to improve the available solar power on CubeSat platforms.

Analog Solar Sensor as Payload in Edusat Satellite

IEEE 2010 Aerospace Conference
Design and development of an analog sun sensor as payload for the UniSat (University of Roma "La Sapienza") satellite space mission.

An innovative deployable solar panel system for Cubesats

Acta Astronautica, Volume 95, February–March 2014, Pages 210–217
Solar power improvements for CubeSat platforms.

Enhancing power analysis attacks against cryptographic devices

IET Circuits
Differential Power Analysis on cryptoprocessors through a custom analog current probe.

Experimental and Theoretical Study of Electrode Effects in HfO2 based RRAM

IEEE
MIM devices for memory application: ReRAM • Memory Characterization of HfO2 cells to verify data retention properties, temperature stability and conductive mechanism with different electrodes

Contacta Michele M. sobre tu trabajo

Inicia sesión para comentar cualquier detalle por chat.

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Principales habilidades

Wireless
Engineering
Electronics
Matlab and Mathematica
Verilog / VHDL

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